• DocumentCode
    2343585
  • Title

    SINR Improvement in OFDM Systems Using VSB-VBL Technique for High Mobility Applications

  • Author

    Babu, K. Vinoth ; Kavitha, K.V.N. ; Babu, K. Murali ; Kumar, P. Siva

  • Author_Institution
    Sch. of Electr. Sci., VIT Univ., Vellore, India
  • fYear
    2009
  • fDate
    27-28 Oct. 2009
  • Firstpage
    808
  • Lastpage
    811
  • Abstract
    OFDM based wireless system provides high spectral efficiency but they are very sensitive to Doppler shift. High mobility causes the channel to be fast fading channel. The rapid variation of the channel can induce inter carrier interference (ICI). ICI due to carrier frequency offset can be mitigated by accurate frequency synchronization but ICI due to fast fading channel is more difficult to handle. Thus ICI reduces the throughput and increases the BER. In this paper we proposed an OFDM system which will use variable sub carrier bandwidth (VSB) with variable bit loading (VBL) to minimize the effect of ICI due to high mobility. We investigate the performance of such VSB-VBL OFDM system with fixed sub carrier bandwidth (FSB-OFDM) system based on signal interference to noise ratio (SINR).
  • Keywords
    OFDM modulation; error statistics; fading channels; intercarrier interference; variable rate codes; OFDM system; VSB-VBL technique; bit error rate; fading channel; fixed sub carrier bandwidth; frequency synchronization; high mobility application; inter carrier interference; signal interference to noise ratio; variable bit loading; variable sub carrier bandwidth; wireless system; Bandwidth; Bit error rate; Doppler shift; Fading; Frequency synchronization; Interference; OFDM; Signal to noise ratio; Throughput; Wireless sensor networks; Channel Estimation Error; FSB-OFDM; ICI; SINR; VSB-VBL OFDM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advances in Recent Technologies in Communication and Computing, 2009. ARTCom '09. International Conference on
  • Conference_Location
    Kottayam, Kerala
  • Print_ISBN
    978-1-4244-5104-3
  • Electronic_ISBN
    978-0-7695-3845-7
  • Type

    conf

  • DOI
    10.1109/ARTCom.2009.160
  • Filename
    5328165