DocumentCode
2343735
Title
The use of a test specification format in automatic test program generation
Author
Verhelst, Bas
Author_Institution
Philips Res. Lab., Eindhoven, Netherlands
fYear
1989
fDate
12-14 Apr 1989
Firstpage
362
Lastpage
368
Abstract
Test specifications formats (TSFs) to facilitate standardization of testing information on ICs and circuit boards are examined. The author describes the application areas of a TSF and shows the practical use of one particular TSF, the neutral code format (NCF) proposed by C. Mortensen (1987). By writing a translator from NCF to a test programming language, it was seen that automatic test program generation is possible. It is found, however, that only GO/NOGO test programs could be generated
Keywords
automatic programming; automatic test equipment; automatic testing; integrated circuit testing; printed circuit testing; program interpreters; CAD/testing integration; GO/NOGO test programs; ICs; PCB; automatic test program generation; neutral code format; standardization; test programming language; test specification format; translator; Automatic testing; Circuit testing; Digital integrated circuits; Electronic equipment testing; Integrated circuit testing; Laboratories; Performance evaluation; Printed circuits; Software packages; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
European Test Conference, 1989., Proceedings of the 1st
Conference_Location
Paris
Print_ISBN
0-8186-1937-6
Type
conf
DOI
10.1109/ETC.1989.36264
Filename
36264
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