Selecting a PRPG: randomness, primitiveness, or sheer luck?

Author

Bayraktaroglu, Ismet ; Orailoglu, Alex

Author_Institution

Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA

fYear

2001

fDate

2001

Firstpage

373

Lastpage

378

Abstract

The ability of randomness to constitute a quality measure in PRPG selection for logic BIST is investigated. Extensive correlation analyses performed on a rich set of pattern generators and benchmark circuits indicate that higher randomness is no guarantee of improved fault coverage in LFSM-based pseudo-random pattern generators. Further evaluation of fault coverage data indicates that the performance of PRPGs is dependent on both circuit particularities and the number of test patterns employed

Keywords

automatic test pattern generation; automatic testing; built-in self test; combinational circuits; correlation methods; fault diagnosis; logic testing; sequential circuits; PRPG; benchmark circuits; circuit particularities; combinational circuits; correlation analyses; fault coverage; fault coverage data; logic BIST; pattern generators; primitiveness; pseudo-random pattern generators; quality measure; randomness; sequential circuits; test patterns; Benchmark testing; Built-in self-test; Circuit faults; Circuit testing; Computer science; Logic testing; Pattern analysis; Performance analysis; Test pattern generators; Time to market;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 2001. Proceedings. 10th Asian

Conference_Location

Kyoto

ISSN

1081-7735

Print_ISBN

0-7695-1378-6

Type

conf

DOI

10.1109/ATS.2001.990311

Filename

990311