DocumentCode
2343851
Title
Study of the dielectric Gaussian surface emissivity feature
Author
Chen, Liang ; Yu, Yang ; Wang, David
Author_Institution
Fac. of Inf. Sci. & Eng., Northeastern Univ., Shenyang
fYear
2008
fDate
3-5 June 2008
Firstpage
1044
Lastpage
1046
Abstract
This paper introduces a study method of dielectric Gaussian surface emissivity based on the scattering feature. The rough surface model is established with the statistical parameters, and the scattering problem of model is calculated by small perturbation method. Consequently the dielectric Gaussian surface emissivity is obtained. Finally the rule of emissivity change is discussed.
Keywords
Gaussian processes; dielectric materials; emissivity; dielectric Gaussian surface emissivity; perturbation method; rough surface model; scattering feature; statistical parameters; Density functional theory; Dielectrics; Information science; Perturbation methods; Rough surfaces; Scattering parameters; Statistics; Surface roughness; Surface waves; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
Conference_Location
Singapore
Print_ISBN
978-1-4244-1717-9
Electronic_ISBN
978-1-4244-1718-6
Type
conf
DOI
10.1109/ICIEA.2008.4582675
Filename
4582675
Link To Document