DocumentCode :
2344098
Title :
Built-out self-test (BOST) for analog circuits in a system LSI test solution to reduce test costs
Author :
Hanai, Hisayoshi ; Yamada, Shinji ; Mori, Hisaya ; Yamashita, Eisaku ; Funakura, Teruhiko
Author_Institution :
Manuf. Technol. & Production Manage. Div., Mitsubishi Electr. Corp., Japan
fYear :
2001
fDate :
2001
Firstpage :
460
Abstract :
BOST (built out self test), puts the high performance test unit on the performance-board and achieves high performance measurement. We focused on D/A and A/D converter testing and developed a BOST which is placed on the performance board and measures and analyzes the electrical D/A and A/D characteristics, statically, such as nonlinearity error, with high resolution and high accuracy in short periods by using a conventional logic tester in the factory. This report describes the outline of BOST and the effect for improvement of test accuracy, and reduction of test time
Keywords :
analogue-digital conversion; automatic testing; digital-analogue conversion; integrated circuit testing; large scale integration; A/D converter; BOST; D/A converter; accuracy; analog circuits; built-out self-test; logic tester; nonlinearity error; performance measurement; resolution; system LSI; test accuracy; test costs; test time; Analog circuits; Automatic testing; Built-in self-test; Circuit testing; Electric variables measurement; Large scale integration; Logic testing; Performance analysis; Performance evaluation; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location :
Kyoto
ISSN :
1081-7735
Print_ISBN :
0-7695-1378-6
Type :
conf
DOI :
10.1109/ATS.2001.990330
Filename :
990330
Link To Document :
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