DocumentCode
2344141
Title
High-speed interface testing [LSI]
Author
Suzuki, M. ; Shimizu, R. ; Naka, N. ; Nakamura, K.
Author_Institution
Fujitsu Labs. Ltd., Japan
fYear
2001
fDate
2001
Firstpage
461
Abstract
One big problem in the high-speed interface macro development and the support for the high-speed network business which Fujitsu held, was solved by the loop back LSI testing technique. In future, Fujitsu want to advance the examination of higher quality and further efficiency improvement for ATE cost reduction
Keywords
automatic test equipment; high-speed integrated circuits; integrated circuit testing; large scale integration; quality control; ATE; Fujitsu; LSI; efficiency; high-speed interface testing; loop back testing technique; macro development; quality; test cost reduction; Built-in self-test; Circuit testing; Clocks; Frequency conversion; Logic testing; Phase locked loops; Semiconductor device testing; Throughput; Transmitters; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location
Kyoto
ISSN
1081-7735
Print_ISBN
0-7695-1378-6
Type
conf
DOI
10.1109/ATS.2001.990331
Filename
990331
Link To Document