Title :
High-speed interface testing [LSI]
Author :
Suzuki, M. ; Shimizu, R. ; Naka, N. ; Nakamura, K.
Author_Institution :
Fujitsu Labs. Ltd., Japan
Abstract :
One big problem in the high-speed interface macro development and the support for the high-speed network business which Fujitsu held, was solved by the loop back LSI testing technique. In future, Fujitsu want to advance the examination of higher quality and further efficiency improvement for ATE cost reduction
Keywords :
automatic test equipment; high-speed integrated circuits; integrated circuit testing; large scale integration; quality control; ATE; Fujitsu; LSI; efficiency; high-speed interface testing; loop back testing technique; macro development; quality; test cost reduction; Built-in self-test; Circuit testing; Clocks; Frequency conversion; Logic testing; Phase locked loops; Semiconductor device testing; Throughput; Transmitters; Wiring;
Conference_Titel :
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location :
Kyoto
Print_ISBN :
0-7695-1378-6
DOI :
10.1109/ATS.2001.990331
