Title :
Non-exhaustive parity testing
Author_Institution :
Sch. of Comput., Shanghai Univ., China
Abstract :
In this paper, some new approaches are presented to deal with the dilemma we are facing in using parity testing: (1) proposing a method of turning a parity untestable circuit into parity testable (2) presenting a scheme of replacing the exhaustive testing with nonexhaustive method. The parity testing may resume its position by using some new technologies including the techniques presented
Keywords :
Boolean functions; VLSI; automatic testing; fault diagnosis; integrated circuit testing; logic testing; Boolean difference; VLSI; faulty function; minterms; nonexhaustive parity testing; parity testable circuit; parity untestable circuit; stuck-at-fault; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Matrix converters; Pins; Resumes; System testing; Turning;
Conference_Titel :
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location :
Kyoto
Print_ISBN :
0-7695-1378-6
DOI :
10.1109/ATS.2001.990335
