DocumentCode
2344222
Title
Non-exhaustive parity testing
Author
Xu, Shiyi
Author_Institution
Sch. of Comput., Shanghai Univ., China
fYear
2001
fDate
2001
Firstpage
468
Abstract
In this paper, some new approaches are presented to deal with the dilemma we are facing in using parity testing: (1) proposing a method of turning a parity untestable circuit into parity testable (2) presenting a scheme of replacing the exhaustive testing with nonexhaustive method. The parity testing may resume its position by using some new technologies including the techniques presented
Keywords
Boolean functions; VLSI; automatic testing; fault diagnosis; integrated circuit testing; logic testing; Boolean difference; VLSI; faulty function; minterms; nonexhaustive parity testing; parity testable circuit; parity untestable circuit; stuck-at-fault; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Matrix converters; Pins; Resumes; System testing; Turning;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location
Kyoto
ISSN
1081-7735
Print_ISBN
0-7695-1378-6
Type
conf
DOI
10.1109/ATS.2001.990335
Filename
990335
Link To Document