Title :
Built-in self-test for state faults induced by crosstalk in sequential circuits
Author :
Shimizu, Kazuya ; Itazaki, Noriyoshi ; Kinoshita, Kozo
Author_Institution :
Graduate Sch. of Eng., Osaka Univ., Japan
Abstract :
With the movement into deep submicron (DSM) technology and GHz clock frequencies, signal integrity problems have become important. Signal integrity problems are induced by circuit noise such as crosstalk, power supply noise. substrate noise. In this paper, we consider crosstalk in such noise and propose a new built-in self-test method for faults induced by crosstalk, called crosstalk faults
Keywords :
VLSI; automatic testing; built-in self test; crosstalk; fault diagnosis; integrated circuit testing; logic testing; sequential circuits; built-in self-test method; crosstalk; crosstalk faults; deep submicron technology; gigahertz clock frequencies; sequential circuits; signal integrity problems; state faults; Built-in self-test; Circuit faults; Circuit noise; Circuit testing; Clocks; Crosstalk; Delay; Polynomials; Sequential circuits; Switching circuits;
Conference_Titel :
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location :
Kyoto
Print_ISBN :
0-7695-1378-6
DOI :
10.1109/ATS.2001.990336
