Title :
3.5 kV trench dual-gate MOS controlled thyristor
Author :
Mehrotra, M. ; Thapar, N. ; Baliga, B.J.
Author_Institution :
Power Semicond. Res. Center, Raleigh, NC, USA
Abstract :
The Insulated Gate Bipolar Transistor (IGBT) offers excellent characteristics for 600-2000 V applications such as in motor control. However, the on-state voltage drop of the IGBT becomes very high when the blocking voltage is increased. MOS-gated thyristors have been reported that utilize current flow via thyristor action to obtain a low on-state voltage drop. However, these devices lack forward bias safe operating area (FBSOA), which makes it difficult to protect the device against short circuit failure. This paper presents a new device structure, the trench dual gate MOS controlled thyristor (T-DGMCT), that exhibits low on-state voltage drop like a MOS Controlled Thyristor (MCT) and current saturation (FBSOA) characteristics like an IGBT while operating at high (3.5 kV) voltages.
Keywords :
MOS-controlled thyristors; 3.5 kV; T-DGMCT; current saturation; forward bias safe operating area; on-state voltage drop; trench dual-gate MOS controlled thyristor; Analytical models; Cathodes; Charge carrier lifetime; Current density; Electrical resistance measurement; Insulated gate bipolar transistors; Low voltage; MOSFET circuits; Thyristors; Voltage control;
Conference_Titel :
Device Research Conference, 1996. Digest. 54th Annual
Conference_Location :
Santa Barbara, CA, USA
Print_ISBN :
0-7803-3358-6
DOI :
10.1109/DRC.1996.546311