DocumentCode
2344439
Title
Negative bulk mobility devices - what next?
Author
Kroemer, Herbert
Author_Institution
Electr. Eng. Dept., Univ. of Colorado, Boulder, CO, USA
fYear
1974
fDate
9-11 Dec. 1974
Firstpage
3
Lastpage
4
Abstract
The transferred-electron (=TE) type negative differential bulk mobility (=NDBM) of the Gunn Effect in GaAs has formed one of the cornerstones of a rapidly growing solid-state microwave technology. Reliable solid-state microwave oscillators with several hundred milliwatts of low-noise c.w. power at X-band are commercially available, as are lower-power oscillators up to at least 70 GHz, and amplifiers to at least half the latter frequency. While these developments have by no means reached their inherent limits yet, new approaches to NDBM are already being explored, to take over where the present ones leave off. In this paper we wish to review briefly three such approaches, in the order of an increasingly speculative nature.
Keywords
Gunn devices; Gunn effect; III-V semiconductors; carrier mobility; gallium arsenide; low-power electronics; microwave oscillators; Gunn effect; NDBM; X-band; amplifiers; low-noise CW power; lower-power oscillators; negative bulk mobility devices; reliable solid-state microwave oscillators; solid-state microwave technology; transferred-electron type negative differential bulk mobility; Gallium arsenide; Indium phosphide; Microwave amplifiers; Microwave oscillators; Superconducting microwave devices; Superlattices;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 1974 International
Conference_Location
Washington, DC
ISSN
0163-1918
Type
conf
DOI
10.1109/IEDM.1974.6219617
Filename
6219617
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