• DocumentCode
    2344439
  • Title

    Negative bulk mobility devices - what next?

  • Author

    Kroemer, Herbert

  • Author_Institution
    Electr. Eng. Dept., Univ. of Colorado, Boulder, CO, USA
  • fYear
    1974
  • fDate
    9-11 Dec. 1974
  • Firstpage
    3
  • Lastpage
    4
  • Abstract
    The transferred-electron (=TE) type negative differential bulk mobility (=NDBM) of the Gunn Effect in GaAs has formed one of the cornerstones of a rapidly growing solid-state microwave technology. Reliable solid-state microwave oscillators with several hundred milliwatts of low-noise c.w. power at X-band are commercially available, as are lower-power oscillators up to at least 70 GHz, and amplifiers to at least half the latter frequency. While these developments have by no means reached their inherent limits yet, new approaches to NDBM are already being explored, to take over where the present ones leave off. In this paper we wish to review briefly three such approaches, in the order of an increasingly speculative nature.
  • Keywords
    Gunn devices; Gunn effect; III-V semiconductors; carrier mobility; gallium arsenide; low-power electronics; microwave oscillators; Gunn effect; NDBM; X-band; amplifiers; low-noise CW power; lower-power oscillators; negative bulk mobility devices; reliable solid-state microwave oscillators; solid-state microwave technology; transferred-electron type negative differential bulk mobility; Gallium arsenide; Indium phosphide; Microwave amplifiers; Microwave oscillators; Superconducting microwave devices; Superlattices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 1974 International
  • Conference_Location
    Washington, DC
  • ISSN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.1974.6219617
  • Filename
    6219617