Title :
The study of TE process based on the improved PCA method
Author :
Yu, Yang ; Zhao, Yawei ; Yang, Qing ; Wang, David ; Chen, Liang
Author_Institution :
Fac. of Inf. Sci.&Eng., Shenyang Ligong Univ., Shenyang
Abstract :
Using principal component analysis and wavelet analysis technology, an improved PCA method is proposed in order to detect industrial faults. The definition of the differences between principal component subspaces is introduced. The program structure of the system is set up based on the improved method. The simulation result shows that the improved PCA has better performance; and gives an efficient illustration for the related problems in the fault detection field.
Keywords :
fault diagnosis; principal component analysis; process monitoring; wavelet transforms; TE process; improved PCA method; industrial fault detection; principal component analysis; principal component subspaces; wavelet analysis technology; Fault detection; Frequency; Information analysis; Monitoring; Principal component analysis; Signal analysis; Signal processing; Tellurium; Wavelet analysis; Wavelet transforms;
Conference_Titel :
Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1717-9
Electronic_ISBN :
978-1-4244-1718-6
DOI :
10.1109/ICIEA.2008.4582712