• DocumentCode
    2344543
  • Title

    The study of TE process based on the improved PCA method

  • Author

    Yu, Yang ; Zhao, Yawei ; Yang, Qing ; Wang, David ; Chen, Liang

  • Author_Institution
    Fac. of Inf. Sci.&Eng., Shenyang Ligong Univ., Shenyang
  • fYear
    2008
  • fDate
    3-5 June 2008
  • Firstpage
    1215
  • Lastpage
    1217
  • Abstract
    Using principal component analysis and wavelet analysis technology, an improved PCA method is proposed in order to detect industrial faults. The definition of the differences between principal component subspaces is introduced. The program structure of the system is set up based on the improved method. The simulation result shows that the improved PCA has better performance; and gives an efficient illustration for the related problems in the fault detection field.
  • Keywords
    fault diagnosis; principal component analysis; process monitoring; wavelet transforms; TE process; improved PCA method; industrial fault detection; principal component analysis; principal component subspaces; wavelet analysis technology; Fault detection; Frequency; Information analysis; Monitoring; Principal component analysis; Signal analysis; Signal processing; Tellurium; Wavelet analysis; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1717-9
  • Electronic_ISBN
    978-1-4244-1718-6
  • Type

    conf

  • DOI
    10.1109/ICIEA.2008.4582712
  • Filename
    4582712