DocumentCode
2344543
Title
The study of TE process based on the improved PCA method
Author
Yu, Yang ; Zhao, Yawei ; Yang, Qing ; Wang, David ; Chen, Liang
Author_Institution
Fac. of Inf. Sci.&Eng., Shenyang Ligong Univ., Shenyang
fYear
2008
fDate
3-5 June 2008
Firstpage
1215
Lastpage
1217
Abstract
Using principal component analysis and wavelet analysis technology, an improved PCA method is proposed in order to detect industrial faults. The definition of the differences between principal component subspaces is introduced. The program structure of the system is set up based on the improved method. The simulation result shows that the improved PCA has better performance; and gives an efficient illustration for the related problems in the fault detection field.
Keywords
fault diagnosis; principal component analysis; process monitoring; wavelet transforms; TE process; improved PCA method; industrial fault detection; principal component analysis; principal component subspaces; wavelet analysis technology; Fault detection; Frequency; Information analysis; Monitoring; Principal component analysis; Signal analysis; Signal processing; Tellurium; Wavelet analysis; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
Conference_Location
Singapore
Print_ISBN
978-1-4244-1717-9
Electronic_ISBN
978-1-4244-1718-6
Type
conf
DOI
10.1109/ICIEA.2008.4582712
Filename
4582712
Link To Document