• DocumentCode
    2344597
  • Title

    Extensions of the effective thickness theory of oxide breakdown

  • Author

    Coleman, Donald J., Jr. ; Hunter, William R. ; Brown, George A. ; Chen, Lh-Chin

  • Author_Institution
    Texas Instrum., Dallas, TX, USA
  • fYear
    1989
  • fDate
    11-13 Apr 1989
  • Firstpage
    39
  • Lastpage
    42
  • Abstract
    The effective thickness concept of oxide breakdown is generalized to a causal time-to-breakdown function, depending only on effective electric field. The function is approximated by a linear and inverse exponential electric-field dependence and applied differentially to data obtained in a pair of step stress tests. The effective thickness distribution is evaluated in both cases and found to be independent of the form chosen. The actual electric-field dependence of the time-to-breakdown function is measured and can be fit with either form over the small range of effective electric fields encountered in the highly accelerated tests. The analysis technique using a pair of tests is presented to illustrate that the effective thickness theory does not require a particular form for the time-to-breakdown function. It demonstrates that the defect density function can be fully obtained at highly accelerated conditions, sampling only a small range of high electric fields. The technique does not of itself allow extrapolation to lower electric fields even though the distribution in effective thickness is known
  • Keywords
    electric breakdown of solids; high field effects; life testing; metal-insulator-semiconductor structures; silicon compounds; SiO2; accelerated tests; causal time-to-breakdown function; defect density function; effective electric field; effective thickness theory; electric-field dependence; high electric fields; oxide breakdown; step stress tests; thickness distribution; Acceleration; Density functional theory; Electric breakdown; Electric variables measurement; Extrapolation; Life estimation; Linear approximation; Sampling methods; Stress; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1989. 27th Annual Proceedings., International
  • Conference_Location
    Phoenix, AZ
  • Type

    conf

  • DOI
    10.1109/RELPHY.1989.36315
  • Filename
    36315