DocumentCode
2344597
Title
Extensions of the effective thickness theory of oxide breakdown
Author
Coleman, Donald J., Jr. ; Hunter, William R. ; Brown, George A. ; Chen, Lh-Chin
Author_Institution
Texas Instrum., Dallas, TX, USA
fYear
1989
fDate
11-13 Apr 1989
Firstpage
39
Lastpage
42
Abstract
The effective thickness concept of oxide breakdown is generalized to a causal time-to-breakdown function, depending only on effective electric field. The function is approximated by a linear and inverse exponential electric-field dependence and applied differentially to data obtained in a pair of step stress tests. The effective thickness distribution is evaluated in both cases and found to be independent of the form chosen. The actual electric-field dependence of the time-to-breakdown function is measured and can be fit with either form over the small range of effective electric fields encountered in the highly accelerated tests. The analysis technique using a pair of tests is presented to illustrate that the effective thickness theory does not require a particular form for the time-to-breakdown function. It demonstrates that the defect density function can be fully obtained at highly accelerated conditions, sampling only a small range of high electric fields. The technique does not of itself allow extrapolation to lower electric fields even though the distribution in effective thickness is known
Keywords
electric breakdown of solids; high field effects; life testing; metal-insulator-semiconductor structures; silicon compounds; SiO2; accelerated tests; causal time-to-breakdown function; defect density function; effective electric field; effective thickness theory; electric-field dependence; high electric fields; oxide breakdown; step stress tests; thickness distribution; Acceleration; Density functional theory; Electric breakdown; Electric variables measurement; Extrapolation; Life estimation; Linear approximation; Sampling methods; Stress; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1989. 27th Annual Proceedings., International
Conference_Location
Phoenix, AZ
Type
conf
DOI
10.1109/RELPHY.1989.36315
Filename
36315
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