• DocumentCode
    2344674
  • Title

    Reliability of electrically conductive adhesives

  • Author

    Kudtarkar, Santosh Anil ; Morris, James E.

  • Author_Institution
    Dept. of Mech. Eng., State Univ. of New York, Binghamton, NY, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    144
  • Lastpage
    150
  • Abstract
    This paper presents data on various ICA reliability tests on electro migration, galvanic corrosion and impact resistance. Ag-loaded ICA samples are prepared with both Ag and Cu metallization pads. Some of these samples are then cured with and with out pre heating. These samples are then successively dropped from heights between one and six feet. Drop test performance is affected by the curing profile detail. Some samples are also subjected to 85/85 humidity tests to study electromigration and galvanic corrosion. Copper and silver boards are used for this and their results are then compared
  • Keywords
    adhesives; conducting materials; corrosion; electromigration; impact testing; metallisation; reliability; Ag; Ag-loaded ICA; Cu; copper board; curing process; drop test; electrically conductive adhesive; electromigration; galvanic corrosion; humidity test; impact resistance; metallization pad; reliability; silver board; Conductive adhesives; Copper; Corrosion; Curing; Electric resistance; Galvanizing; Heating; Independent component analysis; Metallization; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials, 2002. Proceedings. 2002 8th International Symposium on
  • Conference_Location
    Stone Mountain, GA
  • Print_ISBN
    0-7803-7434-7
  • Type

    conf

  • DOI
    10.1109/ISAPM.2002.990378
  • Filename
    990378