• DocumentCode
    2344882
  • Title

    Novel filled no-flow underfill materials and process

  • Author

    Zhang, Zhuqing ; Wong, C.P.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    201
  • Lastpage
    209
  • Abstract
    No-flow underfill has been invented and practiced in the industry for a few years. However, due to the interfering of silica fillers with solder joint formation, most no-flow underfills are not filled with silica fillers and hence have a high coefficient of thermal expansion (CTE), which is undesirable for high reliability. In a novel invention, a double-layer no-flow underfill is implemented to the flip-chip process and allows fillers to be incorporated into the no-flow underfill. The effects of bottom layer underfill thickness, bottom layer underfill viscosity, and reflow profile on the solder wetting properties are investigated in a design of experiment (DOE) using quartz chips. Silica fillers of different sizes and weight percentages are incorporated into the upper layer underfill. The process is implemented using CSP components and corresponding substrates. It is found that the thickness and viscosity of the bottom layer underfill are essential to the wetting of the solder bumps. With high viscosity bottom layer underfill, up to 40 wt% fillers can be added into the upper layer underfill and do not interfere with solder joint formation
  • Keywords
    chip scale packaging; design of experiments; filled polymers; flip-chip devices; reflow soldering; thermal expansion; viscosity; wetting; SiO2; bottom layer underfill thickness; bottom layer underfill viscosity; chip-scale package; design of experiment; double-layer no-flow underfill material; flip-chip process; quartz chip; reflow profile; reliability; silica filler; solder wetting properties; thermal expansion; Curing; Electronic packaging thermal management; Materials science and technology; Silicon compounds; Soldering; Thermal expansion; Thermal stresses; US Department of Energy; Viscosity; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials, 2002. Proceedings. 2002 8th International Symposium on
  • Conference_Location
    Stone Mountain, GA
  • Print_ISBN
    0-7803-7434-7
  • Type

    conf

  • DOI
    10.1109/ISAPM.2002.990387
  • Filename
    990387