• DocumentCode
    2345066
  • Title

    A 1.8-V 3-MS/s 13-bit ΔΣ A/D converter with pseudo data-weighted-averaging in 0.18-μm digital CMOS

  • Author

    Hamoui, Anas A. ; Martin, Ken

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
  • fYear
    2003
  • fDate
    21-24 Sept. 2003
  • Firstpage
    119
  • Lastpage
    122
  • Abstract
    A 1.8 V ΔΣ modulator, fabricated in a 0.18 μm standard digital CMOS process, achieves 81 dB SFDR and 74 dB SNR over a 3 MS/s conversion bandwidth. Its single-loop single-feedback architecture uses a 3rd-order FIR noise-transfer- function and a 5 bit quantizer to render the quantization noise negligible at 16× oversampling. A pseudo data-weighted-averaging technique linearizes the multibit feedback D/A converter, while eliminating the inband signal-dependent tones. The bootstrapped switches in the switched-capacitor implementation reduce the sampling distortion for a 1.85 Vpp input-signal range. The analog and digital power consumptions are 32.4 mW and 12.6 mW, respectively. The on-chip references dissipate 14.4 mW.
  • Keywords
    CMOS integrated circuits; FIR filters; analogue-digital conversion; circuit feedback; delta-sigma modulation; integrated circuit design; linearisation techniques; switched capacitor networks; ΔΣ A/D converter; ΔΣ modulator; 0.18 micron; 1.8 V; 1.85 V; 12.6 mW; 14.4 mW; 32.4 mW; FIR noise-transfer-function; SFDR; SNR; bootstrapped switches; conversion bandwidth; digital CMOS process; inband signal-dependent tones; linearization; multibit feedback D/A converter; on-chip references; oversampling frequency; pseudo data-weighted-averaging; quantization noise; quantizer; sampling distortion; single-loop single-feedback architecture; switched-capacitor circuit; Bandwidth; CMOS process; Delta modulation; Digital modulation; Feedback; Finite impulse response filter; Quantization; Sampling methods; Signal to noise ratio; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2003. Proceedings of the IEEE 2003
  • Print_ISBN
    0-7803-7842-3
  • Type

    conf

  • DOI
    10.1109/CICC.2003.1249373
  • Filename
    1249373