DocumentCode :
2345277
Title :
A study of advanced ALIVH(R) interconnection technology
Author :
Ochi, Shozo ; Echigo, Fumio ; Nakamura, Tadashi ; Tomita, Yoshihiro ; Andoh, Daizo
Author_Institution :
Devices Dev. Center, Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
fYear :
2002
fDate :
2002
Firstpage :
356
Lastpage :
361
Abstract :
We have developed the advanced ALIVH interconnection technology using the new functional materials. The ALIVH (Any Layer Interstitial Via Hole) substrate was developed and introduced into the market in 1996. The ALIVH substrate is a multi layered organic substrate with interstitial via holes in any layers. This substrate has a higher density and performance. The ALIVH substrate is constituted with the key technologies of the non-woven aramid-epoxy prepreg as the insulator material, the via hole drilling process using CO2 laser and the interconnection technology using conductive copper paste. For the interconnection using the conductive paste, to compress the interstitial via hole and preserve its shape effectively is essential. We reported the interconnection technology mainly using aramid-epoxy prepreg in the previous papers. In addition, in order to realize the high performance of the PCBs, we have studied the interconnection technology using the new functional materials. As a result, by controlling the thickness of the resin layer and the viscosity of the resin, the electric interconnections were completed. Now, we are progressing with the ALIVH interconnection technology using the various functional materials in order to reply the several demands on electronic equipment. In this paper, we will introduce the interconnection technology of the advanced ALIVH substrate
Keywords :
interconnections; printed circuit manufacture; substrates; ALIVH interconnection technology; CO2 laser; PCB; any layer interstitial via hole; conductive copper paste; electronic equipment; functional material; insulator material; multilayered organic substrate; nonwoven aramid-epoxy prepreg; resin layer thickness; via hole drilling process; viscosity; Conducting materials; Copper; Drilling; Insulation; Optical materials; Paper technology; Resins; Shape; Thickness control; Viscosity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Packaging Materials, 2002. Proceedings. 2002 8th International Symposium on
Conference_Location :
Stone Mountain, GA
Print_ISBN :
0-7803-7434-7
Type :
conf
DOI :
10.1109/ISAPM.2002.990411
Filename :
990411
Link To Document :
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