Title :
SRX-precursor to large scale high beta plasma devices
Author :
Mendelsohn ; Todd, Alan M. M. ; Wexler ; Navratil, G.A.
Author_Institution :
Grumman Corp. Res. Center, Princeton, NJ, USA
Abstract :
Summary Form only given, as follows. Access to an operation in the second regime, using a large aspect ratio range (R/a=6-9) device, is discussed. The large aspect ratio was chosen to reduce required heating power for second regime studies and to permit large aspect ratio confinement experiments under ohmic, NBI, and ECH heating conditions. In addition, it leads to a simplified machine geometry based on reduced stresses from relatively low values of plasma current and magnetic field strength. Design features include an inside null divertor to test divertor physics at high beta and to provide added flexibility to control the plasma boundary. A close-fitting, adjustable conducting shell providing stabilization against external modes allows study of wall-plasma separation effects and permit R/a variation. The size and field of the SRX conceptual design were selected to minimize cost while maintaining sufficient beam-ion confinement for neutral beam current drive and sufficient bulk-ion thermal confinement for meaningful measurements of tokamak energy confinement scaling at high beta.<>
Keywords :
plasma devices; plasma heating; plasma instability; plasma radiofrequency heating; plasma toroidal confinement; plasma-beam interactions; ECH heating; SRX-precursor; adjustable conducting shell; beam-ion confinement; bulk-ion thermal confinement; confinement experiments; external modes; heating power; large aspect ratio range device; large scale high beta plasma devices; magnetic field strength; neutral beam current drive; neutral beam injection heating; null divertor; ohmic heating; plasma boundary; plasma current; reduced stresses; second regime; simplified machine geometry; stabilization; tokamak energy confinement scaling; wall-plasma separation effects; Electromagnetic heating; Magnetic confinement; Particle collisions; Plasma devices; Plasma heating; Plasma stability;
Conference_Titel :
Plasma Science, 1989. IEEE Conference Record - Abstracts., 1989 IEEE International Conference on
Conference_Location :
Buffalo, NY, USA
DOI :
10.1109/PLASMA.1989.166290