• DocumentCode
    2345419
  • Title

    Software reliability models: an approach to early reliability prediction

  • Author

    Smidts, C. ; Stoddard, R.W. ; Stutzke, M.

  • Author_Institution
    Maryland Univ., College Park, MD, USA
  • fYear
    1996
  • fDate
    30 Oct-2 Nov 1996
  • Firstpage
    132
  • Lastpage
    141
  • Abstract
    Software reliability prediction models are of paramount importance since they provide early identification of cost overruns, software development process issues, optimal development strategies, etc. Existing prediction models were developed mostly during the past 5 to 10 years and, hence, have become obsolete. Furthermore, they are not based on a deep knowledge and understanding of the software development process. This limits their predictive power. This paper presents an approach to the prediction of software reliability based on a systematic identification of software process failure modes and their likelihoods. A direct consequence of the approach and its supporting data collection efforts is the identification of weak areas in the software development process. A Bayesian framework for the quantification of software process failure mode probabilities is recommended since it allows usage of historical data that are only partially relevant to the software at hand. The approach is applied to the requirements analysis phase
  • Keywords
    Bayes methods; identification; prediction theory; software development management; software reliability; Bayesian framework; cost overruns; development strategies; identification of software process failure modes; reliability prediction; requirements analysis; software development process issues; software reliability; Bayesian methods; Cost function; Educational institutions; Failure analysis; Power system reliability; Predictive models; Programming; Scheduling; Software reliability; Software systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering, 1996. Proceedings., Seventh International Symposium on
  • Conference_Location
    White Plains, NY
  • Print_ISBN
    0-8186-7707-4
  • Type

    conf

  • DOI
    10.1109/ISSRE.1996.558733
  • Filename
    558733