DocumentCode
2345507
Title
Design of Bayesian standard fixed duration test plans under exponential distribution
Author
Shi Zhong ; Kuang Zhi-li
Author_Institution
Dept. of Reliability & Environ., CEPREI, Guangzhou, China
fYear
2009
fDate
25-27 May 2009
Firstpage
3989
Lastpage
3991
Abstract
According to the product with the exponential distribution, design features of classical standard fixed duration test plans in actual engineering is studied and summarized, this paper discusses mathematical method of designing Bayesian standard fixed duration test plans.
Keywords
Bayes methods; exponential distribution; reliability theory; statistical testing; Bayesian standard fixed duration test plan; exponential distribution; mathematical method; reliability theory; Bayesian methods; Clocks; Design engineering; Design methodology; Exponential distribution; Probability; Reliability engineering; Statistical analysis; Statistical distributions; Testing; Bayes method; fixed duration; reliability; test plans;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-2799-4
Electronic_ISBN
978-1-4244-2800-7
Type
conf
DOI
10.1109/ICIEA.2009.5138956
Filename
5138956
Link To Document