• DocumentCode
    2345632
  • Title

    Polynomial identity testing for depth 3 circuits

  • Author

    Kayal, Neeraj ; Saxena, Nitin

  • Author_Institution
    Dept. of Comput. Sci. & Eng., IIT Kanpur
  • fYear
    0
  • fDate
    0-0 0
  • Lastpage
    17
  • Abstract
    We study the identity testing problem for depth 3 arithmetic circuits (SigmaPiSigma circuit). We give the first deterministic polynomial time identity test for SigmaPiSigma circuits with bounded top fanin. We also show that the rank of a minimal and simple SigmaPiSigma circuit with bounded top fanin, computing zero, can be unbounded. These results answer the open questions posed by Klivans-Spielman (2001) and Dvir-Shpilka (2005)
  • Keywords
    circuit complexity; digital arithmetic; SigmaPiSigma circuits; bounded top fanin; depth three arithmetic circuits; deterministic polynomial time identity test; polynomial identity testing; Arithmetic; Circuit testing; Complexity theory; Computational complexity; Polynomials; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Complexity, 2006. CCC 2006. Twenty-First Annual IEEE Conference on
  • Conference_Location
    Prague
  • ISSN
    1093-0159
  • Print_ISBN
    0-7695-2596-2
  • Type

    conf

  • DOI
    10.1109/CCC.2006.34
  • Filename
    1663722
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2345632