DocumentCode :
2345695
Title :
Exposure-resilient extractors
Author :
Zimand, Marius
Author_Institution :
Dept. of Comput. & Inf. Sci., Towson Univ., Baltimore, MD
fYear :
0
fDate :
0-0 0
Lastpage :
72
Abstract :
An exposure-resilient extractor is an efficient procedure that, from a random variable with imperfect min-entropy, produces randomness that passes all statistical tests including those that have bounded access to the random variable, with adaptive queries that can depend on the string being tested. More precisely, EXT : {0, 1}n times {0, 1}d rarr {0, 1}m is a (k, epsi)-exposure resilient extractor resistant to q queries if, when the min-entropy of x is at least k and y is random, EXT(x, y) looks epsi-random to all statistical tests modeled by oracle circuits of unbounded complexity that can query q bits of x. We construct, for any delta < 1, a(k, epsi)-exposure resilient extractor with query resistance ndelta, k = n - nOmega(1), epsi = n-Omega(1), m = nOmega(1) and d = O(log n)
Keywords :
computational complexity; minimum entropy methods; statistical analysis; exposure-resilient extractors; imperfect min-entropy; oracle circuits; random variable; unbounded complexity; Circuit testing; Cryptographic protocols; Cryptography; Data mining; Random variables;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Complexity, 2006. CCC 2006. Twenty-First Annual IEEE Conference on
Conference_Location :
Prague
ISSN :
1093-0159
Print_ISBN :
0-7695-2596-2
Type :
conf
DOI :
10.1109/CCC.2006.19
Filename :
1663726
Link To Document :
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