• DocumentCode
    2345713
  • Title

    EEG-Based Emotion Recognition Using Statistical Measures and Auto-Regressive Modeling

  • Author

    Vijayan, Aravind E. ; Sen, Deepak ; Sudheer, A.P.

  • Author_Institution
    Mechatron./Robot. Lab., Nat. Inst. of Technol. Calicut, Calicut, India
  • fYear
    2015
  • fDate
    13-14 Feb. 2015
  • Firstpage
    587
  • Lastpage
    591
  • Abstract
    In this paper, a novel approach towards classification of various human emotions based on statistically weighed autoregressive modeling of Electroencephalogram (EEG) signals is discussed. The proposed algorithm was proven to be superior to many related works, in distinguishing different emotions such as happiness, fear, sadness etc. The findings discussed are based on the results obtained using benchmark emotion based EEG database called DEAP. In this work, epochs were extracted from data using statistical measures such as Shannon Entropy and higher order auto-regressive model was fit to the extracted features. The model was used for classifying human emotions by feeding it into a multi-class Support Vector Machine (MCSVM). The proposed algorithm is proven to be more efficient than existing algorithms as a classification accuracy of 94.097% was obtained.
  • Keywords
    electroencephalography; emotion recognition; feature extraction; higher order statistics; medical signal processing; support vector machines; DEAP; EEG-based emotion recognition; MCSVM; Shannon entropy; benchmark emotion based EEG database; electroencephalogram signals; feature extraction; higher order autoregressive model; multiclass support vector machine; statistically weighed autoregressive modeling; Accuracy; Brain modeling; Electroencephalography; Emotion recognition; Entropy; Feature extraction; Signal processing algorithms; Auto-regression; EEG; Multi Class SVM; Shannon Entropy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence & Communication Technology (CICT), 2015 IEEE International Conference on
  • Conference_Location
    Ghaziabad
  • Print_ISBN
    978-1-4799-6022-4
  • Type

    conf

  • DOI
    10.1109/CICT.2015.24
  • Filename
    7078771