Title :
45-Gb/s SiGe BiCMOS PRBS generator and PRBS checker [pseudorandom bit sequence]
Author :
Kim, Seongwon ; Kapur, Mohit ; Meghelli, Mounir ; Rylyakov, Alexander ; Kwark, Young ; Friedman, Daniel
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
A 27-1 pseudorandom bit sequence (PRBS) generator chip set that operates up to 45 Gb/s was fabricated and tested. The circuits are implemented using bipolar transistors in a SiGe BiCMOS technology and operate from a single -3.3 V power supply. The PRBS generator, which consumes 1.32 W, uses a high speed 4:1 multiplexer to produce the final output from four quarter-rate streams. The automatic synchronizing PRBS checker consumes 1.2 W and uses a half-rate architecture, demultiplexing the full-rate data stream to lower rate streams that are checked in parallel.
Keywords :
BiCMOS logic circuits; binary sequences; demultiplexing equipment; multiplexing equipment; random sequences; synchronisation; -3.3 V; 1.2 W; 1.32 W; 45 Gbit/s; BiCMOS PRBS generator; PRBS checker; PRBS pattern checking; PRBS pattern generation; SiGe; automatic synchronizing checker; bipolar transistors; full-rate data stream demultiplexing; half-rate architecture; high speed multiplexer; pseudorandom bit sequence; quarter-rate streams; BiCMOS integrated circuits; Bit error rate; CMOS technology; Circuit testing; Germanium silicon alloys; Power generation; Power supplies; SONET; Silicon germanium; Telecommunication standards;
Conference_Titel :
Custom Integrated Circuits Conference, 2003. Proceedings of the IEEE 2003
Print_ISBN :
0-7803-7842-3
DOI :
10.1109/CICC.2003.1249410
