DocumentCode
2346422
Title
Building Multi-View System Models for Requirements Engineering
Author
Van Lamsweerde, Axel
Author_Institution
Dept. d´´Ing. Inf., Univ. Catholique de Louvain, Louvain-la-Neuve, Belgium
fYear
2009
fDate
Aug. 31 2009-Sept. 4 2009
Firstpage
368
Lastpage
369
Abstract
This mini-tutorial overviews a blend of complementary techniques for constructing multi-view models for RE. Requirements engineering techniques are faced with a recurring problem of focus and structure. Elicitation techniques raise the problem of focussing and structuring elicitation sessions and artefacts. Evaluation techniques raise the problem of identifying and comparing items at a common level of abstraction and granularity for risk analysis, conflict management, option selection, or prioritization. Specification techniques offer mechanisms for structuring specifications but do not tell us much on how a complex structure should be built through such mechanisms. For quality assurance, inspection techniques are more effective if inspections can be focussed on structured specifications. Validation and verification techniques require the availability of structured specifications as well. Likewise, evolution techniques are more effective when a rich structure is available for defining change units, granularities of traceable items, built-in derivation links, and satisfaction arguments to be replayed in case of change.
Keywords
formal specification; formal verification; quality assurance; software maintenance; software quality; elicitation technique; inspection technique; multiview system model; quality assurance; requirement engineering; software artefact; software change unit; specification technique; structuring elicitation session; validation technique; verification technique; Acceleration; Buildings; Computer languages; Decision making; Education; Inspection; Pattern matching; Quality assurance; Risk analysis; Risk management;
fLanguage
English
Publisher
ieee
Conference_Titel
Requirements Engineering Conference, 2009. RE '09. 17th IEEE International
Conference_Location
Atlanta, GA
ISSN
1090-705X
Print_ISBN
978-0-7695-3761-0
Type
conf
DOI
10.1109/RE.2009.50
Filename
5328496
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