• DocumentCode
    2347098
  • Title

    Preparation of GaAs microwave devices by molecular beam epitaxy

  • Author

    Cho, A.Y. ; Ballamy, W.C. ; Dunn, C.N. ; Kuvas, R.L. ; Schroeder, W.E.

  • Author_Institution
    Bell Labs., Murray Hill, NJ, USA
  • fYear
    1974
  • fDate
    9-11 Dec. 1974
  • Firstpage
    579
  • Lastpage
    582
  • Abstract
    The molecular beam epitaxy technique has been used to prepare IMPATT and mixer diodes with GaAs. Precise doping profile control is achieved by the use of carefully controlled beams of Sn, Si or Ge and an understanding of the doping profiles resulting from a given beam intensity-time profile. Planar isolation is achieved because it is possible to grow semi-insulating poly-crystalline material on an amorphous coating on a substrate while simultaneously growing high quality doped single crystalline material on the substrate exposed through windows in the amorphous coating. Large area (2 cm × 2 cm) layers and layers consisting of semi-insulating areas containing isolated devices have been grown.
  • Keywords
    III-V semiconductors; IMPATT diodes; gallium arsenide; insulating coatings; isolation technology; microwave diodes; microwave mixers; molecular beam epitaxial growth; GaAs; IMPATT; amorphous coating; beam intensity-time profile; high quality doped single crystalline material; microwave device preparation; mixer diodes; molecular beam epitaxy technique; planar isolation; precise doping profile control; semiinsulating poly-crystalline material; Gallium; Gallium arsenide; Laboratories; Molecular beam epitaxial growth; Schottky diodes; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 1974 International
  • Conference_Location
    Washington, DC
  • ISSN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.1974.6219816
  • Filename
    6219816