DocumentCode
2347098
Title
Preparation of GaAs microwave devices by molecular beam epitaxy
Author
Cho, A.Y. ; Ballamy, W.C. ; Dunn, C.N. ; Kuvas, R.L. ; Schroeder, W.E.
Author_Institution
Bell Labs., Murray Hill, NJ, USA
fYear
1974
fDate
9-11 Dec. 1974
Firstpage
579
Lastpage
582
Abstract
The molecular beam epitaxy technique has been used to prepare IMPATT and mixer diodes with GaAs. Precise doping profile control is achieved by the use of carefully controlled beams of Sn, Si or Ge and an understanding of the doping profiles resulting from a given beam intensity-time profile. Planar isolation is achieved because it is possible to grow semi-insulating poly-crystalline material on an amorphous coating on a substrate while simultaneously growing high quality doped single crystalline material on the substrate exposed through windows in the amorphous coating. Large area (2 cm × 2 cm) layers and layers consisting of semi-insulating areas containing isolated devices have been grown.
Keywords
III-V semiconductors; IMPATT diodes; gallium arsenide; insulating coatings; isolation technology; microwave diodes; microwave mixers; molecular beam epitaxial growth; GaAs; IMPATT; amorphous coating; beam intensity-time profile; high quality doped single crystalline material; microwave device preparation; mixer diodes; molecular beam epitaxy technique; planar isolation; precise doping profile control; semiinsulating poly-crystalline material; Gallium; Gallium arsenide; Laboratories; Molecular beam epitaxial growth; Schottky diodes; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 1974 International
Conference_Location
Washington, DC
ISSN
0163-1918
Type
conf
DOI
10.1109/IEDM.1974.6219816
Filename
6219816
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