Title :
System-level infrastructure for boot-time testing and configuration of networks-on-chip with programmable routing logic
Author :
Ghiribaldi, Alberto ; Ludovici, Daniele ; Favalli, Michele ; Bertozzi, Davide
Author_Institution :
ENDIF, Univ. of Ferrara, Ferrara, Italy
Abstract :
Networks-on-chip need to survive to manufacturing faults in order to sustain yield. An effective testing and configuration strategy however implies two opposite requirements. On one hand, a fast and scalable built-in self-testing and self-diagnosis procedure has to be carried out concurrently at NoC switches. On the other hand, programming the NoC routing mechanism to go around faulty links and switches can be optimally performed by a centralized controller with global network visibility. This paper proposes a global hardware infrastructure that meets such requirements by means of a fault-tolerant dual network architecture and a configuration strategy for reprogramming the routing mechanism of each switch. This is the first complete infrastructure for testing and reconfiguring a NoC based on reprogrammable routing logic.
Keywords :
built-in self test; fault tolerance; network routing; network-on-chip; programmable logic devices; NoC routing; boot-time testing; built-in self-testing; configuration strategy; fault-tolerant dual network architecture; global network visibility; manufacturing faults; networks-on-chip; reprogrammable routing logic; self-diagnosis procedure; system-level infrastructure; Built-in self-test; Control systems; Fault tolerance; Fault tolerant systems; Routing; Topology;
Conference_Titel :
VLSI and System-on-Chip (VLSI-SoC), 2011 IEEE/IFIP 19th International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4577-0171-9
Electronic_ISBN :
978-1-4577-0169-6
DOI :
10.1109/VLSISoC.2011.6081597