Title :
CMOS SRAM functional test with quiescent write supply current
Author :
Hashizume, Masaki ; Tamesada, Takeomi ; Koyama, Takeshi ; van de Goor, A.J.
Author_Institution :
Tokushima Univ., Japan
Abstract :
A large quiescent supply current of mA order flows when a data is written in a CMOS SRAM IC. In this paper an SRAM test method is proposed which is based on the supply current and whose purpose is to detect logically faulty IC´s. The method is evaluated by some experiments. In the experiments, about 80% of faulty CMOS SRAM IC´s are detected. Also it is shown that the total test time can be reduced if the method is used in the pretest stage of a functional test
Keywords :
CMOS memory circuits; SRAM chips; fault diagnosis; integrated circuit testing; CMOS SRAM; SRAM functional test; faulty ICs; functional test; logically faulty IC; pretest stage; quiescent write supply current; total test time; CMOS integrated circuits; CMOS logic circuits; Circuit faults; Circuit testing; Current supplies; Electrical fault detection; Fault detection; Integrated circuit testing; Logic testing; Random access memory;
Conference_Titel :
IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-8186-9191-3
DOI :
10.1109/IDDQ.1998.730724
