DocumentCode
2347743
Title
CMOS SRAM functional test with quiescent write supply current
Author
Hashizume, Masaki ; Tamesada, Takeomi ; Koyama, Takeshi ; van de Goor, A.J.
Author_Institution
Tokushima Univ., Japan
fYear
1998
fDate
12-13 Nov 1998
Firstpage
4
Lastpage
8
Abstract
A large quiescent supply current of mA order flows when a data is written in a CMOS SRAM IC. In this paper an SRAM test method is proposed which is based on the supply current and whose purpose is to detect logically faulty IC´s. The method is evaluated by some experiments. In the experiments, about 80% of faulty CMOS SRAM IC´s are detected. Also it is shown that the total test time can be reduced if the method is used in the pretest stage of a functional test
Keywords
CMOS memory circuits; SRAM chips; fault diagnosis; integrated circuit testing; CMOS SRAM; SRAM functional test; faulty ICs; functional test; logically faulty IC; pretest stage; quiescent write supply current; total test time; CMOS integrated circuits; CMOS logic circuits; Circuit faults; Circuit testing; Current supplies; Electrical fault detection; Fault detection; Integrated circuit testing; Logic testing; Random access memory;
fLanguage
English
Publisher
ieee
Conference_Titel
IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on
Conference_Location
San Jose, CA
Print_ISBN
0-8186-9191-3
Type
conf
DOI
10.1109/IDDQ.1998.730724
Filename
730724
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