DocumentCode :
2347783
Title :
Between AUC based and error rate based learning
Author :
Toh, Kar-Ann
Author_Institution :
Biometrics Eng. Res. Center, Yonsei Univ., Seoul
fYear :
2008
fDate :
3-5 June 2008
Firstpage :
2116
Lastpage :
2120
Abstract :
Based on an earlier solution to optimize an approximated area under the ROC Curve (AUC) for binary pattern classification in [1], this paper investigates into the relationship between AUC and several error rate based classifiers. Via a generalized framework of translated scaling-space, we find that the AUC based classifier can be related to a total-error-rate (TER) classifier, an Equal Error Rate (EER) formulation, and a least-squares-error (LSE) estimator, each under a specific setting of the translated scaling-space framework. Several potential applications of the generalized framework are subsequently discussed.
Keywords :
error statistics; learning (artificial intelligence); least squares approximations; pattern classification; sensitivity analysis; ROC curve; area-under-the-curve based learning; binary pattern classification; equal error rate formulation; error rate based learning; least-squares-error estimator; total-error-rate classifier; translated scaling-space framework; Biometrics; Closed-form solution; Design optimization; Error analysis; Joining processes; Least squares approximation; Least squares methods; Parametric statistics; Pattern classification; Polynomials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1717-9
Electronic_ISBN :
978-1-4244-1718-6
Type :
conf
DOI :
10.1109/ICIEA.2008.4582893
Filename :
4582893
Link To Document :
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