• DocumentCode
    2347783
  • Title

    Between AUC based and error rate based learning

  • Author

    Toh, Kar-Ann

  • Author_Institution
    Biometrics Eng. Res. Center, Yonsei Univ., Seoul
  • fYear
    2008
  • fDate
    3-5 June 2008
  • Firstpage
    2116
  • Lastpage
    2120
  • Abstract
    Based on an earlier solution to optimize an approximated area under the ROC Curve (AUC) for binary pattern classification in [1], this paper investigates into the relationship between AUC and several error rate based classifiers. Via a generalized framework of translated scaling-space, we find that the AUC based classifier can be related to a total-error-rate (TER) classifier, an Equal Error Rate (EER) formulation, and a least-squares-error (LSE) estimator, each under a specific setting of the translated scaling-space framework. Several potential applications of the generalized framework are subsequently discussed.
  • Keywords
    error statistics; learning (artificial intelligence); least squares approximations; pattern classification; sensitivity analysis; ROC curve; area-under-the-curve based learning; binary pattern classification; equal error rate formulation; error rate based learning; least-squares-error estimator; total-error-rate classifier; translated scaling-space framework; Biometrics; Closed-form solution; Design optimization; Error analysis; Joining processes; Least squares approximation; Least squares methods; Parametric statistics; Pattern classification; Polynomials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1717-9
  • Electronic_ISBN
    978-1-4244-1718-6
  • Type

    conf

  • DOI
    10.1109/ICIEA.2008.4582893
  • Filename
    4582893