Title :
Transient current testing based on current (charge) integration
Author :
De Paúl, I. ; Picos, R. ; Rosselló, J.L. ; Roca, M. ; Isern, E. ; Segura, J. ; Hawkins, C.F.
Author_Institution :
Phys. Dept., Balearic Islands Univ., Palma de Mallorca, Spain
Abstract :
We evaluated a technique that uses power supply charge as the test observable. Charge was computed from the measured supply transient current waveform. Data show that this method is efficient to detect those defects that prevent current elevation (mainly “hard” opens) and therefore represents a valid extension of IDDQ
Keywords :
CMOS digital integrated circuits; electric charge; electric current measurement; integrated circuit testing; transients; IDDQ testing; charge integration; current integration; digital CMOS ICs; power supply charge; supply transient current waveform; transient current testing; Atherosclerosis; Charge measurement; Circuit testing; Current measurement; Decoding; Monitoring; Power supplies; Shift registers; Transient analysis; Voltage;
Conference_Titel :
IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-8186-9191-3
DOI :
10.1109/IDDQ.1998.730728
