DocumentCode
2347821
Title
Transient current testing based on current (charge) integration
Author
De Paúl, I. ; Picos, R. ; Rosselló, J.L. ; Roca, M. ; Isern, E. ; Segura, J. ; Hawkins, C.F.
Author_Institution
Phys. Dept., Balearic Islands Univ., Palma de Mallorca, Spain
fYear
1998
fDate
12-13 Nov 1998
Firstpage
26
Lastpage
30
Abstract
We evaluated a technique that uses power supply charge as the test observable. Charge was computed from the measured supply transient current waveform. Data show that this method is efficient to detect those defects that prevent current elevation (mainly “hard” opens) and therefore represents a valid extension of IDDQ
Keywords
CMOS digital integrated circuits; electric charge; electric current measurement; integrated circuit testing; transients; IDDQ testing; charge integration; current integration; digital CMOS ICs; power supply charge; supply transient current waveform; transient current testing; Atherosclerosis; Charge measurement; Circuit testing; Current measurement; Decoding; Monitoring; Power supplies; Shift registers; Transient analysis; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on
Conference_Location
San Jose, CA
Print_ISBN
0-8186-9191-3
Type
conf
DOI
10.1109/IDDQ.1998.730728
Filename
730728
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