DocumentCode :
2347894
Title :
Projection learning models
Author :
Toh, Kar-Ann ; Teoh, Andrew Beng Jin
Author_Institution :
Biometrics Eng. Res. Center, Yonsei Univ., Seoul
fYear :
2008
fDate :
3-5 June 2008
Firstpage :
2151
Lastpage :
2155
Abstract :
This paper proposes a learning framework based on projection. Essentially, the learning framework exploits the advantages of linear learning paradigms for regression and classification applications. By incorporating appropriate nonlinear basis or embedding functions, the projection learning framework can be applied to learn arbitrary functions. Several preliminary case studies are provided to evident the behavior of a few specific projection models.
Keywords :
learning (artificial intelligence); pattern classification; regression analysis; classification applications; linear learning paradigms; projection learning models; regression applications; Biometrics; Explosions; Polynomials; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1717-9
Electronic_ISBN :
978-1-4244-1718-6
Type :
conf
DOI :
10.1109/ICIEA.2008.4582899
Filename :
4582899
Link To Document :
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