Title :
Projection learning models
Author :
Toh, Kar-Ann ; Teoh, Andrew Beng Jin
Author_Institution :
Biometrics Eng. Res. Center, Yonsei Univ., Seoul
Abstract :
This paper proposes a learning framework based on projection. Essentially, the learning framework exploits the advantages of linear learning paradigms for regression and classification applications. By incorporating appropriate nonlinear basis or embedding functions, the projection learning framework can be applied to learn arbitrary functions. Several preliminary case studies are provided to evident the behavior of a few specific projection models.
Keywords :
learning (artificial intelligence); pattern classification; regression analysis; classification applications; linear learning paradigms; projection learning models; regression applications; Biometrics; Explosions; Polynomials; Testing;
Conference_Titel :
Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1717-9
Electronic_ISBN :
978-1-4244-1718-6
DOI :
10.1109/ICIEA.2008.4582899