Title :
Testing of microprocessor devices on the basis of artificial neural networks with changeable parameters
Author :
Viktor, Lokazyuk ; Viktor, Cheshun ; Vitaliy, Choyenkiy
Author_Institution :
Ternopil Acad. of a Nat. Economy
Abstract :
The base principles of a technique of application of 3-layer feedforward fullconnected artificial neural network for execution of adaptive algorithms of testing of digital microprocessor devices are considered. The method of change of weight coefficients and thresholds of artificial neurons in the mode of operation of artificial neural network realized at the hardware level is considered. The application of this method provides implementation of adaptive algorithms of testing of the large complexity with the limited hardware resources of artificial neural network
Keywords :
fault diagnosis; feedforward neural nets; microcomputers; adaptive algorithm; artificial neurons; digital microprocessor devices testing; feedforward fullconnected artificial neural network; Adaptive algorithm; Algorithm design and analysis; Artificial neural networks; Binary trees; Frequency; Microprocessors; Neural network hardware; Neurons; Productivity; Testing;
Conference_Titel :
Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, 2003. Proceedings of the Second IEEE International Workshop on
Conference_Location :
Lviv
Print_ISBN :
0-7803-8138-6
DOI :
10.1109/IDAACS.2003.1249551
