Testing of microprocessor devices on the basis of artificial neural networks with changeable parameters

Author

Viktor, Lokazyuk ; Viktor, Cheshun ; Vitaliy, Choyenkiy

Author_Institution

Ternopil Acad. of a Nat. Economy

fYear

2003

fDate

8-10 Sept. 2003

Firstpage

210

Lastpage

213

Abstract

The base principles of a technique of application of 3-layer feedforward fullconnected artificial neural network for execution of adaptive algorithms of testing of digital microprocessor devices are considered. The method of change of weight coefficients and thresholds of artificial neurons in the mode of operation of artificial neural network realized at the hardware level is considered. The application of this method provides implementation of adaptive algorithms of testing of the large complexity with the limited hardware resources of artificial neural network

Keywords

fault diagnosis; feedforward neural nets; microcomputers; adaptive algorithm; artificial neurons; digital microprocessor devices testing; feedforward fullconnected artificial neural network; Adaptive algorithm; Algorithm design and analysis; Artificial neural networks; Binary trees; Frequency; Microprocessors; Neural network hardware; Neurons; Productivity; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, 2003. Proceedings of the Second IEEE International Workshop on

Conference_Location

Lviv

Print_ISBN

0-7803-8138-6

Type

conf

DOI

10.1109/IDAACS.2003.1249551

Filename

1249551