• DocumentCode
    2348132
  • Title

    Dimensionality Reduction of Extracted Feature Database for Face Recognition System Using Two Dimensional Maximum Margin Criteria

  • Author

    Gaikwad, K.P. ; More, S.A.

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Walchand Coll. Of Eng., Sangli, India
  • fYear
    2010
  • fDate
    26-28 Nov. 2010
  • Firstpage
    415
  • Lastpage
    418
  • Abstract
    In statistical pattern recognition, high dimensionality is a major cause of the practical limitations of many pattern recognition technologies. Moreover, it has been observed that a large number of features may actually degrade the performance of classifiers if the number of training samples is small relative to the number of features. This fact, which is referred to as the “peaking phenomenon”, is caused by the “curse of dimensionality”. In this paper solution to this problem is stated. Dimensionality of images after feature extraction for storing feature database is reduced in this paper. The input for the system is images from standard database. Features are extracted of given images using Two Dimensional Maximum Margin Criteria from row as well as column direction.
  • Keywords
    face recognition; feature extraction; image classification; classifiers performance; curse of dimensionality; dimensionality reduction; face recognition system; feature database extraction; image dimension; peaking phenomenon; statistical pattern recognition; two dimensional maximum margin criteria; Small Sample Size (SSS); Two-Dimensional Maximum Margin Criteria (2D2MMC); face recognition; feature extraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence and Communication Networks (CICN), 2010 International Conference on
  • Conference_Location
    Bhopal
  • Print_ISBN
    978-1-4244-8653-3
  • Electronic_ISBN
    978-0-7695-4254-6
  • Type

    conf

  • DOI
    10.1109/CICN.2010.85
  • Filename
    5702005