DocumentCode :
2348152
Title :
An image processing system for the monitoring of special nuclear material and personnel
Author :
Thai, Tan ; Carlson, Jeff ; Urenda, Dan ; Cooley, Tim
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fYear :
1994
fDate :
12-14 Oct 1994
Firstpage :
39
Lastpage :
42
Abstract :
An important aspect of insider protection in production facilities is the monitoring of the movement of special nuclear material (SNM) and personnel. One system developed at Sandia National Labs for this purpose is the Personnel and Material Tracking System (PAMTRAK). PAMTRAK can intelligently integrate different sensor technologies and the security requirements of a facility to provide a unique capability in monitoring and tracking SNM and personnel. Currently many sensor technologies are used to track the location of personnel and SNM inside a production facility. These technologies are generally intrusive; they require special badges be worn by personnel, special tags be connected to material, and special detection devices be mounted in the area. Video technology, however, is non-intrusive because it does not require that personnel wear special badges or that special tags be attached to SNM. Sandia has developed a video-based image processing system consisting of three major components: the Material Monitoring Subsystem (MMS), the Personnel Tracking Subsystem (PTS) and the Item Recognition Subsystem (IRS)
Keywords :
computerised monitoring; image processing; nuclear engineering computing; nuclear materials safeguards; personnel; safety systems; Item Recognition Subsystem; Material Monitoring Subsystem; PAMTRAK; Personnel Tracking Subsystem; Personnel and Material Tracking System; Sandia; detection devices; image processing system; monitoring; non-intrusive; nuclear material; personnel; special nuclear material; video-based image processing; Image processing; Personnel location monitoring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Security Technology, 1994. Proceedings. Institute of Electrical and Electronics Engineers 28th Annual 1994 International Carnahan Conference on
Conference_Location :
Albuquerque, NM
Print_ISBN :
0-7803-1479-4
Type :
conf
DOI :
10.1109/CCST.1994.363797
Filename :
363797
Link To Document :
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