Quasi-optical measurement technique for low-loss materials in short millimeter and submillimeter wave ranges

Author

Meriakri, V.V.

fYear

2004

fDate

6-9 Sept. 2004

Firstpage

225

Lastpage

227

Abstract

This study presents a set up for measurement of different low-loss materials and substances (liquid and solid-state dielectrics, ferroelectrics, semiconductors, ferrites, composite, building, nature and commonly used materials and media) in short millimetre (MM) and submillimetre wave (SMM) ranges, mainly at the wavelengths λ = 3.0 - 0.6 mm. This measurement technique for materials investigation in MM and SMM ranges uses quasi-optical lens beam waveguide spectroscopy methods. This version of MM and SMM spectroscopy has some advantages in frequency range 50 - 500 GHz.

Keywords

lenses; millimetre wave measurement; millimetre wave spectroscopy; optical losses; optical materials; optical waveguides; submillimetre wave measurement; submillimetre wave spectroscopy; 3.0 to 6.0 mm; 50 to 500 GHz; building materials; composite materials; ferrites; ferroelectrics; liquids; low-loss materials; quasioptical measurement; semiconductors; short millimeter wave range; solid-state dielectrics; submillimeter wave range; Composite materials; Dielectric liquids; Dielectric materials; Dielectric measurements; Ferroelectric materials; Measurement techniques; Optical materials; Semiconductor materials; Spectroscopy; Submillimeter wave technology;

fLanguage

English

Publisher

ieee

Conference_Titel

Laser and Fiber-Optical Networks Modeling, 2004. Proceedings of LFNM 2004. 6th International Conference on

Print_ISBN

0-7803-8429-6

Type

conf

DOI

10.1109/LFNM.2004.1382471

Filename

1382471