DocumentCode
2348710
Title
High performance fault simulation for digital systems
Author
Hahanov, Vladimir ; Krivoulya, Gennadiy ; Hahanova, Irina ; Melnikova, Olga ; Obrizan, Vladimir
fYear
2003
fDate
8-10 Sept. 2003
Firstpage
390
Lastpage
395
Abstract
Fast backtraced deductive-parallel fault simulation method oriented on processing of complex digital devices containing hundreds of thousand equivalent gates is offered. Data structures and algorithms for method realization are described
Keywords
automatic test pattern generation; digital circuits; fault simulation; graph theory; logic gates; ATPG; back traced simulation; data structure; deductive-parallel fault simulation; digital device; digital system; fault analysis model; Analytical models; Circuit faults; Circuit simulation; Circuit testing; Digital circuits; Digital systems; Electrical fault detection; Equations; Fault detection; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, 2003. Proceedings of the Second IEEE International Workshop on
Conference_Location
Lviv
Print_ISBN
0-7803-8138-6
Type
conf
DOI
10.1109/IDAACS.2003.1249593
Filename
1249593
Link To Document