DocumentCode :
2348711
Title :
On the functional test of Branch Prediction Units based on Branch History Table
Author :
Sanchez, E. ; Reorda, M. Sonza ; Tonda, A.
Author_Institution :
Dipt. di Autom. e Inf., Politec. di Torino, Turino, Italy
fYear :
2011
fDate :
3-5 Oct. 2011
Firstpage :
278
Lastpage :
283
Abstract :
Branch Prediction Units (BPUs) are highly efficient modules that can significantly decrease the negative impact of branches in superscalar and RISC processors. Traditional test solutions, mainly based on scan test, are often inadequate to tackle the complexity of these architectures, especially when dealing with delay faults that require at-speed stimuli application. Moreover, scan test does not represent a viable solution when Incoming Inspection or on-line test are considered. In this paper a functional approach targeting BPU test is proposed, allowing to generate a suitable test program whose effectiveness is independent on the specific implementation of the BPU. The effectiveness of the approach is validated on a Branch History Table (BHT) resorting to an open-source computer architecture simulator and to an ad hoc developed HDL testbench. Experimental results show that the proposed method is able to thoroughly test the BHT, reaching complete static fault coverage.
Keywords :
fault diagnosis; program testing; public domain software; reduced instruction set computing; BPU test; HDL testbench; RISC processors; at-speed stimuli application; branch history table; branch prediction units; delay faults; functional test; incoming inspection; online test; open-source computer architecture simulator; program testing; scan test; static fault coverage; superscalar processors; Circuit faults; Computer architecture; Decoding; History; Program processors; Radiation detectors; Testing; branch history table; branch prediction unit; functional test; sbst;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI and System-on-Chip (VLSI-SoC), 2011 IEEE/IFIP 19th International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4577-0171-9
Electronic_ISBN :
978-1-4577-0169-6
Type :
conf
DOI :
10.1109/VLSISoC.2011.6081650
Filename :
6081650
Link To Document :
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