DocumentCode :
234872
Title :
On the Field Patterns in Elliptic-Shaped Microshield Lines Loaded with Left-Handed Materials by the Edge-Based Finite Element Method
Author :
Hai Sun
Author_Institution :
Sch. of Math. & Informational Sci., Leshan Normal Univ., Leshan, China
fYear :
2014
fDate :
15-16 Nov. 2014
Firstpage :
330
Lastpage :
333
Abstract :
The field patterns in elliptic-shaped microshield lines loaded with left-handed materials are analyzed by edge-based finite element method. The left-handed material is defined by assigning to it a negative permittivity and negative permeability simultaneously. The field patterns include the dominant mode and the first higher-order mode. Some illustrated figures provided in this paper are considered useful in novel microwave and millimeter devices.
Keywords :
electromagnetic fields; electromagnetic shielding; finite element analysis; microwave devices; microwave metamaterials; millimetre wave devices; permeability; permittivity; edge-based finite element method; elliptic-shaped microshield lines; field patterns; left-handed materials; microwave devices; millimeter devices; negative permeability; negative permittivity; Finite element analysis; Metamaterials; Microwave circuits; Microwave integrated circuits; Optical waveguides; edge-based finite element method; elliptic-shaped microshield lines; field patterns;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Intelligence and Security (CIS), 2014 Tenth International Conference on
Conference_Location :
Kunming
Print_ISBN :
978-1-4799-7433-7
Type :
conf
DOI :
10.1109/CIS.2014.34
Filename :
7016911
Link To Document :
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