مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2348858

Title :

High-Coulomb Triggered Vacuum Switch

Author :

Chen, Y.G. ; Dethlefsen, R. ; Crumley, R. ; Sidorow, V.A. ; Vozdvijenskii, V.A.

Volume :

fYear :

1993

fDate :

21-23 June 1993

Firstpage :

938

Keywords :

Cathodes; Circuit testing; Delay; Electromagnetic launching; Jitter; Laboratories; Life testing; Power supplies; Switches; Voltage;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Pulsed Power Conference, 1993. Digest of Technical Papers., Ninth IEEE International

Conference_Location :

Albuquerque, NM, USA

Print_ISBN :

0-7803-1415-8

Type :

conf

DOI :

10.1109/PPC.1993.514079

Filename :

514079

Link To Document :