DocumentCode :
2349288
Title :
Extraction of EVM from Transmitter System Parameters
Author :
Nassery, Afsaneh ; Ozev, Sule ; Verhelst, Marian ; Slamani, Mustapha
Author_Institution :
Electr. Eng., Arizona State Univ., Tempe, AZ, USA
fYear :
2011
fDate :
23-27 May 2011
Firstpage :
75
Lastpage :
80
Abstract :
Error Vector Magnitude (EVM) is a system-level parameter that is specified for most advanced communication standards. EVM measurement often takes extensive test development efforts, tester resources, and long test times. Since EVM is analytically related to system impairments, which are typically measured in a production test environment, it can be eliminated from the test list if the relations between EVM and system impairments are derived in a manner that is independent of the circuit implementation and manufacturing process. In this paper, we focus on the WLAN standard, and derive the relations between EVM and three of the most detrimental impairments for QAM/OFDM based systems: IQ imbalance, non-linearity, and noise. Simulations and hardware experiments show that the accuracy of the analytical models is in par with a direct EVM measurement with a reasonable test time.
Keywords :
OFDM modulation; analogue circuits; circuit testing; production testing; quadrature amplitude modulation; radio transmitters; wireless LAN; EVM extraction; EVM measurement; IQ imbalance; QAM-OFDM based system; WLAN standard; advanced communication standard; circuit implementation; error vector magnitude; manufacturing process; production test environment; test development; tester resource; transmitter system parameter; Analytical models; Equations; Mathematical model; Noise; OFDM; Quadrature amplitude modulation; Wireless LAN;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ETS), 2011 16th IEEE European
Conference_Location :
Trondheim
ISSN :
1530-1877
Print_ISBN :
978-1-4577-0483-3
Electronic_ISBN :
1530-1877
Type :
conf
DOI :
10.1109/ETS.2011.46
Filename :
5957926
Link To Document :
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