DocumentCode
2349410
Title
Towards formal probabilistic models for progression of diseases
Author
Fong, A.C.M. ; Simpson, Andrew
Author_Institution
Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore
fYear
2008
fDate
3-5 June 2008
Firstpage
2565
Lastpage
2568
Abstract
Diseases such as cancers are among the top killers in many countries, causing tens of thousands of premature deaths worldwide. Unlike many contagious diseases, however, many types of cancers often exhibit clear progression patterns in progression such that early detection can improve the odds of a patientpsilas survival. In fact, even total recovery is possible in some cases. Precise modelling of cancer progression can therefore potentially reduce the number of deaths caused by cancer. In an effort to contribute towards better modelling, this paper presents a two-step formal probabilistic model to describe the progression of cancers. In the first step, we develop a formal functional model using communicating sequential processes (CSP), which is a well-established formal description language for reasoning about concurrency and state machines. In particular, we map various cancer progression stages to states and then we introduce probabilistic behaviors to model state transition in the second step. Where probability distributions are available, the resultant model can then be used to extract quantitative information such as the expected time to terminal stage or death from the time when the cancer is first diagnosed.
Keywords
cancer; finite state machines; physiological models; probability; tumours; cancer progression; cancer staging; communicating sequential processes; disease progression; finite state machines; formal functional model; formal probabilistic models; patient survival; probability distribution; state transition; Automata; Biomedical computing; Cancer detection; Concurrent computing; Data mining; Diseases; Medical services; Probability distribution; Risk management; Statistics; Formal description methods; cancer staging; disease progression modelling; finite state machine;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
Conference_Location
Singapore
Print_ISBN
978-1-4244-1717-9
Electronic_ISBN
978-1-4244-1718-6
Type
conf
DOI
10.1109/ICIEA.2008.4582983
Filename
4582983
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