DocumentCode :
2349469
Title :
Constraint-Based Hierarchical Untestability Identification for Synchronous Sequential Circuits
Author :
Raik, Jaan ; Rannaste, Anna ; Jenihhin, Maksim ; Viilukas, Taavi ; Ubar, Raimund ; Fujiwara, Hideo
Author_Institution :
Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
fYear :
2011
fDate :
23-27 May 2011
Firstpage :
147
Lastpage :
152
Abstract :
The paper proposes a new hierarchical untestable stuck-at fault identification method for non-scan sequential circuits containing feedback loops. The method is based on deriving, minimizing and solving test path activation constraints for modules embedded into Register-Transfer Level (RTL) designs. First, an RTL test pattern generator is applied in order to extract the set of all possible test path activation constraints for a module under test. Then, the constraints are minimized and a constraint-driven deterministic test pattern generator is run providing hierarchical test generation and untestability proof in sequential circuits. We show by experiments that the tool is capable of quickly proving a large number of untestable faults obtaining high fault efficiency. As a side effect, our study shows that traditional bottom-up test generation based on symbolic test environment generation at RTL is too optimistic due to the fact that propagation constraints are ignored.
Keywords :
automatic test pattern generation; fault diagnosis; feedback; logic testing; modules; sequential circuits; RTL design; RTL test pattern generator; constraint-based hierarchical untestability identification; constraint-driven deterministic test pattern generator; fault efficiency; feedback loop; hierarchical untestable stuck-at fault identification method; module under test; register-transfer level design; symbolic test environment generation; synchronous sequential circuit; test path activation constraint; Algebra; Benchmark testing; Circuit faults; Integrated circuit modeling; Sequential circuits; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ETS), 2011 16th IEEE European
Conference_Location :
Trondheim
ISSN :
1530-1877
Print_ISBN :
978-1-4577-0483-3
Electronic_ISBN :
1530-1877
Type :
conf
DOI :
10.1109/ETS.2011.38
Filename :
5957938
Link To Document :
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