DocumentCode
2349480
Title
SOI MESFETs for extreme environment buck regulators
Author
Lepkowski, W. ; Goryll, M. ; Wilk, S.J. ; Zhang, Y. ; Sochacki, J. ; Thornton, T.J.
Author_Institution
Arizona State Univ., Tempe, AZ, USA
fYear
2011
fDate
3-6 Oct. 2011
Firstpage
1
Lastpage
2
Abstract
The next step to confirm the MESFET´s ability to handle extreme environments will be testing the buck regulator in the presence of radiation. These measurements will be completed in the coming month and the results presented at the conference. Eventually the goal will be to integrate the MESFET with the feedback circuitry and to more carefully design the buck regulator board, choosing components that maximize the efficiency and reduce the parasitics. Already extensive work has been done to reduce the layout size of the MESFET in Fig. 2 by over 50%.
Keywords
CMOS integrated circuits; Schottky gate field effect transistors; silicon-on-insulator; CMOS; SOI MESFET; extreme environment buck regulator board; feedback circuitry; radiation presence; CMOS integrated circuits; Logic gates; MESFETs; Regulators; Schottky diodes; Voltage control; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference (SOI), 2011 IEEE International
Conference_Location
Tempe, AZ
ISSN
1078-621X
Print_ISBN
978-1-61284-761-0
Electronic_ISBN
1078-621X
Type
conf
DOI
10.1109/SOI.2011.6081696
Filename
6081696
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