• DocumentCode
    2349539
  • Title

    The repeatability of code defect classifications

  • Author

    El Emam, Khaled ; Wieczorek, Isabella

  • Author_Institution
    Fraunhofer Inst. for Exp. Software Eng., Kaiserslatuern, Germany
  • fYear
    1998
  • fDate
    4-7 Nov 1998
  • Firstpage
    322
  • Lastpage
    333
  • Abstract
    Counts of defects found during the various defect defection activities in software projects and their classification provide a basis for product quality evaluation and process improvement. However, since defect classifications are subjective, it is necessary to ensure that they are repeatable (i.e., that the classification is not dependent on the individual). We evaluate a slight adaptation of a commonly used defect classification scheme that has been applied in IBM´s Orthogonal Defect Classification work, and in the SEI´s Personal Software Process. The evaluation utilizes the Kappa statistic. We use defect data from code inspections conducted during a development project. Our results indicate that the classification scheme is in general repeatable. We further evaluate classes of defects to find out if confusion between some categories is more common, and suggest a potential improvement to the scheme
  • Keywords
    project management; software fault tolerance; software performance evaluation; software quality; statistical analysis; Kappa statistic; Orthogonal Defect Classification work; Personal Software Process; classification scheme; code defect classifications; code inspections; commonly used defect classification scheme; defect data; defect defection activities; development project; process improvement; product quality evaluation; repeatability; software projects; Data analysis; Data mining; Information analysis; Inspection; Investments; Meeting planning; Process planning; Sensitivity analysis; Software engineering; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering, 1998. Proceedings. The Ninth International Symposium on
  • Conference_Location
    Paderborn
  • ISSN
    1071-9458
  • Print_ISBN
    0-8186-8991-9
  • Type

    conf

  • DOI
    10.1109/ISSRE.1998.730897
  • Filename
    730897