DocumentCode
2349539
Title
The repeatability of code defect classifications
Author
El Emam, Khaled ; Wieczorek, Isabella
Author_Institution
Fraunhofer Inst. for Exp. Software Eng., Kaiserslatuern, Germany
fYear
1998
fDate
4-7 Nov 1998
Firstpage
322
Lastpage
333
Abstract
Counts of defects found during the various defect defection activities in software projects and their classification provide a basis for product quality evaluation and process improvement. However, since defect classifications are subjective, it is necessary to ensure that they are repeatable (i.e., that the classification is not dependent on the individual). We evaluate a slight adaptation of a commonly used defect classification scheme that has been applied in IBM´s Orthogonal Defect Classification work, and in the SEI´s Personal Software Process. The evaluation utilizes the Kappa statistic. We use defect data from code inspections conducted during a development project. Our results indicate that the classification scheme is in general repeatable. We further evaluate classes of defects to find out if confusion between some categories is more common, and suggest a potential improvement to the scheme
Keywords
project management; software fault tolerance; software performance evaluation; software quality; statistical analysis; Kappa statistic; Orthogonal Defect Classification work; Personal Software Process; classification scheme; code defect classifications; code inspections; commonly used defect classification scheme; defect data; defect defection activities; development project; process improvement; product quality evaluation; repeatability; software projects; Data analysis; Data mining; Information analysis; Inspection; Investments; Meeting planning; Process planning; Sensitivity analysis; Software engineering; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Reliability Engineering, 1998. Proceedings. The Ninth International Symposium on
Conference_Location
Paderborn
ISSN
1071-9458
Print_ISBN
0-8186-8991-9
Type
conf
DOI
10.1109/ISSRE.1998.730897
Filename
730897
Link To Document