Title :
Problems or opportunities? Beyond the 90nm frontier [Keynote]
Abstract :
Provides an abstract of the keynote presentation and a brief professional biography of the presenter. The complete presentation was not made available for publication as part of the conference proceedings.
Keywords :
Cost function; Electronic design automation and methodology; Explosions; Moore´s Law; Optical design; Radio frequency; Radiofrequency identification; Space technology; Technological innovation; Technology management;
Conference_Titel :
Computer Aided Design, 2004. ICCAD-2004. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-8702-3
DOI :
10.1109/ICCAD.2004.1382522
