• DocumentCode
    2349799
  • Title

    Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis

  • Author

    Alves, N. ; Shi, Y. ; Imbriglia, N. ; Dworak, J. ; Nepal, K. ; Bahar, R.I.

  • Author_Institution
    Sch. of Eng., Brown Univ., Providence, RI, USA
  • fYear
    2011
  • fDate
    23-27 May 2011
  • Firstpage
    211
  • Lastpage
    211
  • Abstract
    We propose using logic implications as a source of online diagnostic data for on-chip test set selection by taking advantage of their ability to automatically identify a restricted set of faults as the potential cause of an observed error. This information will be used to dynamically choose a test set to detect systematic latent defects or wear out in a multi core system.
  • Keywords
    dynamic testing; error detection; integrated circuit testing; system-on-chip; dynamic test set selection; implication-based on-chip diagnosis; Arrays; Electrical engineering; Hardware; Multicore processing; Runtime; System-on-a-chip; Systematics; Logic Implications; on-chip diagnosis; test set selection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2011 16th IEEE European
  • Conference_Location
    Trondheim
  • ISSN
    1530-1877
  • Print_ISBN
    978-1-4577-0483-3
  • Electronic_ISBN
    1530-1877
  • Type

    conf

  • DOI
    10.1109/ETS.2011.59
  • Filename
    5957957
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2349799