Title :
Comparison of small-signal output conductance frequency dependence in UTBB SOI MOSFETs with and without ground plane
Author :
Makovejev, S. ; Raskin, J. -P ; Flandre, D. ; Olsen, S. ; Andrieu, F. ; Poiroux, T. ; Kilchytska, V.
Author_Institution :
Sch. of Electr., Electron. & Comput. Eng., Newcastle Univ., Newcastle upon Tyne, UK
Abstract :
Ultra-thin body with ultra-thin buried oxide (UTBB) n-channel devices on silicon-on-insulator platform with and without ground plane are characterised over a wide frequency range. Self-heating effect and source-to-drain coupling through the substrate clearly manifest themselves through the output conductance variation with frequency. In this work, we experimentally show that introduction of a p-type ground plane (GP) significantly reduces output conductance degradation with frequency and results in improved analogue performance comparing with devices without GP.
Keywords :
MOSFET; electric admittance; silicon-on-insulator; UTBB SOI MOSFET; output conductance degradation reduction; output conductance variation; p-type ground plane; self-heating effect; silicon-on-insulator platform; small-signal output conductance frequency dependence; source-to-drain coupling; ultra-thin body device; ultra-thin buried oxide n-channel device; Couplings; Degradation; Logic gates; MOSFETs; Performance evaluation; Silicon; Substrates;
Conference_Titel :
SOI Conference (SOI), 2011 IEEE International
Conference_Location :
Tempe, AZ
Print_ISBN :
978-1-61284-761-0
Electronic_ISBN :
1078-621X
DOI :
10.1109/SOI.2011.6081717