Title :
A simple technique for IIP3 prediction from the gain compression curve
Author :
Cho, Choongeol ; Eisenstadt, William R.
Keywords :
Analytical models; Circuit testing; Costs; Distortion measurement; Gain measurement; Power amplifiers; Power measurement; Production; Radio frequency; Radiofrequency amplifiers;
Conference_Titel :
Wireless and Microwave Technology, 2005. WAMICON 2005. The 2005 IEEE Annual Conference
Print_ISBN :
0-7803-8861-5
DOI :
10.1109/WAMIC.2005.1528387
