Title :
Temperature-Variation-Aware Test Pattern Optimization
Author :
Yoneda, Tomokazu ; Nakao, Makoto ; Inoue, Michiko ; Sato, Yasuo ; Fujiwara, Hideo
Author_Institution :
Nara Inst. of Sci. & Technol., Ikoma, Japan
Abstract :
For accurate failure prediction, it is important to eliminate the environmental delay variations from the measure delays for capturing the actual delay shift caused by aging. This paper presents a novel test pattern optimization method to reduces spatial and temporal temperature variations during delay test.
Keywords :
ageing; automatic test pattern generation; delays; integrated circuit reliability; integrated circuit testing; temperature; aging; delay shift; delay testing; failure prediction; spatial temperature variation; temperature variation aware test pattern optimization; temporal temperature variation; test pattern optimization method; Europe;
Conference_Titel :
Test Symposium (ETS), 2011 16th IEEE European
Conference_Location :
Trondheim
Print_ISBN :
978-1-4577-0483-3
Electronic_ISBN :
1530-1877
DOI :
10.1109/ETS.2011.45
