• DocumentCode
    2349981
  • Title

    Monte Carlo evaluation of energy transport parameters for an accurate high-field energy-balance model of charge transport in GaAs

  • Author

    Peskin, M. ; Maziar, C.M.

  • Author_Institution
    Microelectron. Res. Center, Texas Univ., Austin, TX, USA
  • fYear
    1995
  • fDate
    16-17 May 1995
  • Firstpage
    197
  • Lastpage
    200
  • Abstract
    Hydrodynamic models based on the relaxation time approximation have been widely employed as a means of simulating carrier transport in high field regimes where the standard drift-diffusion equations are no longer accurate. In particular, an Energy-Balance formalism due to Stratton has been successfully applied to device simulations in silicon, allowing accurate determination of high-field effects. Unfortunately, direct application of the standard form of Stratton´s model to semiconductors exhibiting multi-valley transport at high fields (e.g. GaAs) can lead to non-physical results. We will circumvent this weakness in Stratton´s original approach by employing full bandstructure (pseudopotential) Monte Carlo simulation to directly calculate several Energy Transport parameters for the model. We believe that this is the first time that the Monte Carlo technique has been employed for this purpose. As a prototype material we will use GaAs, which exhibits strong multi-valley transport effects electric fields above 4 kV/cm
  • Keywords
    III-V semiconductors; Monte Carlo methods; band structure; carrier mobility; gallium arsenide; high field effects; hot carriers; many-valley semiconductors; semiconductor device models; GaAs; Monte Carlo evaluation; carrier transport; energy transport parameters; energy-balance model; full bandstructure simulation; high field regimes; hot carriers; hydrodynamic models; multi-valley transport effects; semiconductor device models; Computational modeling; Equations; Gallium arsenide; Hydrodynamics; III-V semiconductor materials; Microelectronics; Monte Carlo methods; Semiconductor materials; Semiconductor process modeling; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    University/Government/Industry Microelectronics Symposium, 1995., Proceedings of the Eleventh Biennial
  • Conference_Location
    Austin, TX
  • ISSN
    0749-6877
  • Print_ISBN
    0-7803-2596-6
  • Type

    conf

  • DOI
    10.1109/UGIM.1995.514144
  • Filename
    514144