Title :
Analytical modeling of crosstalk noise waveforms using Weibull function
Author :
Kasnavi, Alireza ; Wang, Joddy W. ; Shahram, Mahmoud ; Zejda, Jindrich
Author_Institution :
Synopsys, Inc., Mountain View, CA, USA
Abstract :
To analyze the failure of a CMOS circuit due to glitches induced by capacitive crosstalk, noise immunity curves (a.k.a. noise rejection curve) must be characterized. However, noise waveform models currently used for characterization such as ideal triangle and trapezoid can underestimate the propagated noise pulse by over 20% and result in missed violations. We provide an analytical solution to fit any given crosstalk noise waveform to a Weibull function, which can generate identical propagated glitch heights compared to SPICE, resulting in accurate noise immunity curves.
Keywords :
Weibull distribution; circuit analysis computing; crosstalk; integrated circuit modelling; integrated circuit noise; integrated circuit reliability; waveform analysis; CMOS circuit failure; Weibull function; analytical modeling; capacitive crosstalk; crosstalk noise waveforms; identical propagated glitch heights; missed violations; noise immunity curves; noise rejection curve; propagated noise pulse; Analytical models; Circuit noise; Crosstalk; Failure analysis; Noise figure; Noise generators; Noise shaping; SPICE; Semiconductor device modeling; Silicon;
Conference_Titel :
Computer Aided Design, 2004. ICCAD-2004. IEEE/ACM International Conference on
Print_ISBN :
0-7803-8702-3
DOI :
10.1109/ICCAD.2004.1382561
